MONTERROZA RIOS, álvaro David. Technical Artifacts: Which approach is best?. []. , 44, pp.7-7. ISSN 0121-3628.

The paper describes the strengths and weaknesses of the three dominant approaches in the ontological theories of technical artifacts, which are the approaches: (1) functional, (2) intentional and (3) dual. I will show it is not appropriate to focus solely on "functions" or "intentions" to formulate a general theory of artifacts. The dual approach should not miss out on material and structural elements, but must also be consistent with symbolic elements and context in which humans live.

: Technical artifacts; philosophy of technology; dual approach; Dual Nature of Technical Artifacts.

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