Abstract

MARIN, Diana Milena; GOMEZ BOTERO, Maryory Astrid; MIRA, Rodolfo  and  ECHEVERRIA, Félix. Obtaining and evaluation of material films with electronic applications by means of accelerated tests of corrosion. Ing. Desarro. [online]. 2008, n.23, pp.59-71. ISSN 0122-3461.

The air of this study was to evaluate the corrosion behaviour of different materials employed in electronics. Thin films of Al, Cu, Ni an bilayer of Cu/Au were deposited by PVD on mica substrates. The coatings were exposed at accelerated corrosion test in chamber, using atmospheres containing NOx and SO2. The films were tested both connected and as individual parts. The total exposure time was weeks. Roughness and electrical resistance of the coatings across the exposure time and they were studied by optical microscopy, STM, SEM and EDS. The bilayer Cu/AU shows more stability compared with Cu according to the accelerated corrosion test. EDS analysis identified the presence of the corrosive aggressive species.

Keywords : Corrosion; electronic devices; PVD; STM; accelerated tests; SEM; EDS; roughness; electrical resistance.

        · abstract in Spanish     · text in Spanish     · Spanish ( pdf )