SciELO - Scientific Electronic Library Online

 
vol.13 issue2Quantum chaos in rectangular billiardElectronic band structure of the ordered Zn0.5Cd0.5Se alloy calculated by the semi-empirical tight-binding method considering second-nearest neighbor author indexsubject indexarticles search
Home Pagealphabetic serial listing  

Services on Demand

Journal

Article

Indicators

Related links

  • On index processCited by Google
  • Have no similar articlesSimilars in SciELO
  • On index processSimilars in Google

Share


Universitas Scientiarum

Print version ISSN 0122-7483

Abstract

RODRIGUEZ, Hernán  and  JIMENEZ, L. Camilo. Unit for monitoring and controlling the hall effect using labview®. Univ. Sci. [online]. 2008, vol.13, n.2, pp.188-197. ISSN 0122-7483.

We assembled a Hall effect and electric conductivity measuring unit that allows the determination of transport properties in semiconductor and metal films, including the type and concentration of majority carriers and their mobility, from measurements of Hall voltage and current. It is clear that electrons are the charge carrier in metals, however some metals such as aluminum, zinc and cadmium among others exhibit a behavior that, according to the classical view, should be positive charge carriers (holes). In this paper we discuss Hall effect measurements in two types of materials: copper (Cu) and zinc (Zn). Results from measurements show that copper has a negative Hall coefficient RH = - (0.28 ± 0.01)×10-10 m3/C and zinc has a positive coefficient RH = + (4.2 ± 0.2)×10-11 m3/C. Our results agree with those reported in the scientific literature. Most of the textbooks on solid state physics do not mention explicitly the reason why some metals show a positive Hall coefficient. We discuss this fact based on their band structures.

Keywords : Hall effect; semiconductor; metal; LabVIEW.

        · abstract in Spanish     · text in Spanish     · Spanish ( pdf )

 

Creative Commons License All the contents of this journal, except where otherwise noted, is licensed under a Creative Commons Attribution License