Resumen

DUSSAN CUENCA, Anderon; QUIROZ GAITAN, Heiddy Paola  y  SENA GAIBAO, Neyder Jesús. IDENTIFICATION OF A NEW PHASE IN THE CRYSTAL STRUCTURE OF COMPOSITE QUATERNARY Cu₂ZnSnSe₄ STAGE DURING INCORPORATION OF ZnSe. Rev.EIA.Esc.Ing.Antioq [online]. 2014, n.spe1, pp.25-29. ISSN 1794-1237.

This work presents a study of the structural properties of thin films of the compound Cu₂ZnSnSe₄ varying both mass (M_X) and the substrate temperature which was evaporated (T_s) ZnSe binary compound. All samples were deposited by co-evaporation method in three phases keeping all other parameters constant. From measurements of x-ray diffraction it was possible to establish T_s increasing the presence of associated binary phase's quaternary compound during the growth process of the material. It was found that around the main peak, 2θ = 27,1°, predominantly binary phases and the presence of ZnSe which is formed during the subsequent step of selenization of the material. A sort of fork in the main peak (2θ = 27,1°) was observed for the transition between M_ZnSe = 0,153 g to 0,171 g. X-Ray diffraction measurements were made at binary compound pure, observing a correspondence with the peaks found around the main peak of the compound. A study by Raman spectroscopy, Raman shifts associated evidenced binary compounds observed by XRD. From the Scherrer equation it was found that crystallite sizes range between 80 and 90 nm.

Palabras clave : Structural Proprieties; X-Ray; Quaternary Compounds; Propriedades estruturais; Raios X; Compostos quaternários.

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