SciELO - Scientific Electronic Library Online

 
vol.24 número2Estimación de los límites aceptables de tolerancia del costo en ambientes de incertidumbre utilizando simulación de Monte CarloRemoción de colorantes azul brillante y violeta de metilo de soluciones acuosas utilizando cáscara de yuca (Manihot esculenta) modificada con ácido fosfórico índice de autoresíndice de materiabúsqueda de artículos
Home Pagelista alfabética de revistas  

Servicios Personalizados

Revista

Articulo

Indicadores

Links relacionados

  • En proceso de indezaciónCitado por Google
  • No hay articulos similaresSimilares en SciELO
  • En proceso de indezaciónSimilares en Google

Compartir


Ingeniería y competitividad

versión impresa ISSN 0123-3033versión On-line ISSN 2027-8284

Resumen

BOTERO-LONDONO, Mónica A et al. Software app development to determine optical constants in non-homogeneous semiconductor thin films. Ing. compet. [online]. 2022, vol.24, n.2, e21711553.  Epub 26-Mayo-2022. ISSN 0123-3033.  https://doi.org/10.25100/iyc.v24i2.11553.

This work introduces the design and development of a useful software app for studying the optical properties of semiconductor materials; thus, it is possible to know if the deposited non-homogeneous semiconductor thin films are suitable for the fabrication of semiconductor devices. Using the developed algorithm, which is based on Swanepoel's methods, it is possible to estimate optical constants of non-homogeneous semiconductor films such as: absorption coefficient (α), refractive index (n) and band gap (E g ). In addition, the variation of the thickness in them is estimated. The input information for this tool corresponds to the spectral transmittance curves from experimental procedures. The proposed tool was found to offer high accuracy and therefore it can be used to study the properties of semiconductor thin films used in semiconductor manufacturing in a variety of applications, including clean and renewable energies such as solar cells.

Palabras clave : Software; Semiconductor materials; Thin film; Optical constants.

        · resumen en Español     · texto en Español     · Español ( pdf )